Authors:
Vladyslav Zubkov, ETH Zurich; Tommaso Sacchetti and Daniele Antonioli, EURECOM; Martin Strohmeier, armasuisse Science & Technology

Vladyslav Zubkov, ETH Zurich; Tommaso Sacchetti and Daniele Antonioli, EURECOM; Martin Strohmeier, armasuisse Science & Technology