Skip to main content
  • Conferences
  • Students
Sign in
Gold Sponsor
Gold Sponsor
Gold Sponsor
Gold Sponsor
Silver Sponsor
Silver Sponsor
Silver Sponsor
Silver Sponsor
Media Sponsor
Media Sponsor
Media Sponsor
Media Sponsor
Media Sponsor
Media Sponsor
Media Sponsor
Media Sponsor
Media Sponsor
Media Sponsor
Media Sponsor
Industry Partner
Industry Partner
Industry Partner

USENIX ATC '15 button

Get more
Help Promote graphics!


  •  Twitter
  •  Facebook
  •  LinkedIn
  •  Google+
  •  YouTube
Tweets by @usenix
  • Event Code of Conduct
  • Conference Network Policy
  • Statement on Environmental Responsibility Policy
Tweet

connect with us

Authors: 

Jia-Ju Bai, Yu-Ping Wang, Jie Yin, and Shi-Min Hu, Tsinghua University

Abstract: 

Device drivers may encounter errors when communicating with OS kernel and hardware. However, error handling code often gets insufficient attention in driver development and testing, because these errors rarely occur in real execution. For this reason, many bugs are hidden in error handling code. Previous approaches for testing error handling code often neglect the characteristics of device drivers, which limits their efficiency and accuracy. In this paper, we first study the source code of Linux drivers to find useful characteristics of error handling code. Then we use these characteristics in fault injection testing, and propose a practical approach named EH-Test, which can automatically and efficiently test error handling code in drivers. To improve the representativeness of injected faults, we design a pattern-based extraction strategy to automatically and accurately extract target functions which can actually fail and trigger error handling code. During execution, we use a monitor to record runtime information and pair checkers to check resource usages. We have evaluated EH-Test on 15 real Linux device drivers and found 50 new bugs in Linux 3.17.2. The code coverage is also effectively increased. Comparison experiments to some previous approaches also show the availability of EH-Test.

Jia-Ju Bai, Tsinghua University

Yu-Ping Wang, Tsinghua University

Jie Yin, Tsinghua University

Shi-Min Hu, Tsinghua University

Open Access Media

USENIX is committed to Open Access to the research presented at our events. Papers and proceedings are freely available to everyone once the event begins. Any video, audio, and/or slides that are posted after the event are also free and open to everyone. Support USENIX and our commitment to Open Access.

BibTeX
@inproceedings {196269,
author = {Jia-Ju Bai and Yu-Ping Wang and Jie Yin and Shi-Min Hu},
title = {Testing Error Handling Code in Device Drivers Using Characteristic Fault Injection},
booktitle = {2016 USENIX Annual Technical Conference (USENIX ATC 16)},
year = {2016},
isbn = {978-1-931971-30-0},
address = {Denver, CO},
pages = {635--647},
url = {https://www.usenix.org/conference/atc16/technical-sessions/presentation/bai},
publisher = {USENIX Association},
month = jun
}
Download
Bai PDF
View the slides

Presentation Audio

MP3 Download

Download Audio

  • Log in or register to post comments
  • Privacy Policy
  • Contact Us

© USENIX
EIN 13-3055038