Authors:
Yuyang Gong, Zhuo Chen, Jiawei Liu, Miaokun Chen, Fengchang Yu, and Wei Lu, Wuhan University; Xiaofeng Wang, ACM Member; Xiaozhong Liu, Worcester Polytechnic Institute

Yuyang Gong, Zhuo Chen, Jiawei Liu, Miaokun Chen, Fengchang Yu, and Wei Lu, Wuhan University; Xiaofeng Wang, ACM Member; Xiaozhong Liu, Worcester Polytechnic Institute