@inproceedings {203636,
	author = {Christian Bayens and Tuan Le and Luis Garcia and Raheem Beyah and Mehdi Javanmard and Saman Zonouz},
	title = {See No Evil, Hear No Evil, Feel No Evil, Print No Evil? Malicious Fill Patterns Detection in Additive Manufacturing},
	booktitle = {26th USENIX Security Symposium (USENIX Security 17)},
	year = {2017},
	isbn = {978-1-931971-40-9},
	address = {Vancouver, BC},
	pages = {1181--1198},
	url = {https://www.usenix.org/conference/usenixsecurity17/technical-sessions/presentation/bayens},
	publisher = {USENIX Association},
	month = aug
}
